Name: Inside Nand Flash Memories (en Inglés)
Price: 4632.07 MXN
Availability: InStock
Author: Micheloni, Rino ; Crippa, Luca ; Marelli, Alessia
ISBN: 9789400798342

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portada Inside Nand Flash Memories (en Inglés)

Formato

Libro Físico

Autor

Editorial

Idioma

Inglés

N° páginas

582

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 3.0 cm

Peso

0.82 kg.

ISBN13

9789400798342

Categorías

Fïsica de la materia condensada
Análisis espectral | espectroquímica
Electrónica: circuitos y componentes

Inside Nand Flash Memories (en Inglés)

Rino Micheloni (Autor) · Luca Crippa (Autor) · Alessia Marelli (Autor) · Springer · Tapa Blanda

Libro Físico

$ 4,632.07

$ 8,421.95

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Inside Nand Flash Memories (en Inglés)"

Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just imagine how our recent habits would change if the NAND memories suddenly disappeared. To take a picture it would be necessary to find a film (as well as a traditional camera...), disks or even magnetic tapes would be used to record a video or to listen a song, and a cellular phone would return to be a simple mean of communication rather than a multimedia console. The development of NAND Flash memories will not be set down on the mere evolution of personal entertainment systems since a new killer application can trigger a further success: the replacement of Hard Disk Drives (HDDs) with Solid State Drives (SSDs). SSD is made up by a microcontroller and several NANDs. As NAND is the technology driver for IC circuits, Flash designers and technologists have to deal with a lot of challenges. Therefore, SSD (system) developers must understand Flash technology in order to exploit its benefits and countermeasure its weaknesses. Inside NAND Flash Memories is a comprehensive guide of the NAND world: from circuits design (analog and digital) to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.