Name: CHEMICALLY DEPOSITED CuI THIN FILMS AND ITS PROPERTIES (en Inglés)
Price: 1376.82 MXN
Availability: InStock
Author: Ahirrao, Prakash B. ; Shinde, Mahendra S.
ISBN: 9786138952473

Envío gratis

portada CHEMICALLY DEPOSITED CuI THIN FILMS AND ITS PROPERTIES (en Inglés)

Formato

Libro Físico

Autor

Prakash B. Ahirrao

Mahendra S. Shinde

Editorial

Scholars' Press

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

Dimensiones

22.9 x 15.2 x 0.6 cm

Peso

0.15 kg.

ISBN13

9786138952473

Categorías

Química industrial e ingeniería química

CHEMICALLY DEPOSITED CuI THIN FILMS AND ITS PROPERTIES (en Inglés)

Prakash B. Ahirrao (Autor) · Mahendra S. Shinde (Autor) · Scholars' Press · Tapa Blanda

Libro Nuevo

$ 1,376.82

$ 2,503.31

Ahorras: $ 1,126.49

45% descuento

Envío normal

Origen: Estados Unidos (Costos de importación incluídos en el precio)

Se enviará desde nuestra bodega entre el Lunes 05 de Agosto y el Viernes 16 de Agosto.

Lo recibirás en cualquier lugar de México entre 1 y 3 días hábiles luego del envío.

Reseña del libro "CHEMICALLY DEPOSITED CuI THIN FILMS AND ITS PROPERTIES (en Inglés)"

Materials have received immense attention due to their wide applications in various fields of science and technology and can be classified as metals, polymers, ceramics, composites, semiconductors, bio-materials and nanomaterials. Materials science is a broad field and can be considered to be an interdisciplinary area. Included within it are the studies of the structure and properties of any material, the material engineering to suit the needs of specific application.In this book we have presented detail study of the growth, Optimised preparative parameters, structural, optical, and electrical properties of CuI thin films are deposited using modified chemical bath deposition (M-CBD) technique and chemical bath deposition (CBD) techniques. in addition to this the analysis by The various experimental characterization techniques like X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDAX), optical absorption, electrical resistivity, thermoemf measurement techniques, PEC Property in dark and after illumination of light are given here